摘要：
示例代码: 阅读全文
摘要：
示例代码: #include <stdio.h>#define N 200 int main(void){ int num[N][N]; int i= 0, j = 0 , k = 0 , sum = 0; int m = 0 , n = 0 ; scanf("%d %d",&m,&n); for 阅读全文
摘要：
示例代码: #include <stdio.h> int main(void){ int t1 = 0 , t2 = 0 , l1 = 0 , l2 = 0 ; int v1 = 0 , v2 = 0 , t = 0 , s = 0 , l = 0 ; scanf("%d %d %d %d %d", 阅读全文
摘要：
思路: 1.当测试与被测试的芯片全部可以互相测试时，为好芯片; 示例代码: #include <stdio.h>#define N 20 int main(void){ int n = 0 ; int i = 0 , j = 0 , a = 0 , b = 0; int num[N][N] = {0 阅读全文