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4.3. Metrology system design The metrology loop should measure the position of the probe relative to the product within the measurement plane. The pro 阅读全文
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Abstract The application of error separation techniques to roundness measuring instruments is investigated experimentally, using digital computers. Th 阅读全文
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We present a new reconstruction method for measuring profile of large, ultraprecise absolute optical surfaces with a compact interferometer. The profi 阅读全文
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The metrology system measures the position of the probe relative to the product in the six critical directions in the plane of motion of the probe (th 阅读全文
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The motion system positions the probe relative to the product in 4 degrees of freedom. The product is mounted on an air bearing spindle (), and the pr 阅读全文
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A cylindrical scanning setup with an optical distance probe is non-contact, universal and fast. With a probe with 5 mm range, circular tracks on freef 阅读全文
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This paper presents the full research and development cycle of a high-precision absolute linear encoder based on a standard calibrated scale. Already 阅读全文
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The performance of high-precision optical systems using spherical optics is limited by aberrations. By applying aspherical and freeform optics, the ge 阅读全文
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Summary The performance of high-precision optical systems using spherical optics is limited by aberrations. By applying aspherical and freeform optics 阅读全文
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参考: 1.Why Do I Receive Timeout Error -1073807339 on VISA Read or Write? - National Instruments http://digital.ni.com/public.nsf/allkb/874B379E24C0A0D6 阅读全文