2020年2月11日
The NANOMEFOS non-contact measurement machine for freeform optics
摘要： A separate metrology system measures the displacement of the probe relative to the product, in the plane of motion of the probe.This way most of the c 阅读全文
posted @ 2020-02-11 22:27 lhmchn 阅读(291) 评论(0) 推荐(0) 编辑