2018年7月2日
Exact reconstruction method for on-machine measurement of profile
摘要： We present a new reconstruction method for measuring profile of large, ultraprecise absolute optical surfaces with a compact interferometer. The profi 阅读全文
posted @ 2018-07-02 15:04 lhmchn 阅读(170) 评论(0) 推荐(0) 编辑